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Testability Analysis Module (TAM) |
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Testability Analysis Module (TAM) |
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Testability Analysis Module (TAM)
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Testability Analysis Module (TAM) |
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Testability Analysis Module (TAM) |
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Testability Analysis Module (TAM) allows definition of detection methods (tests) for each failure mode. Test indications and efficiency may also be specified.
With this information RAM Commander may provide the following:
| • | list of Undetectable (Latent or Dormant) events, their probabilities and MTBF |
| • | calculate test coverage for system and system parts |
| • | generate ambiguity groups report |
| • | generate optimal fault isolation procedure with replace recommendations |
| • | and more. |
The starting condition for this analysis is that there must be at least one test defined in the FMECA library. Test types (e.g. Visual, BIT etc.) should be also defined before you start working with tests. TAM information is always entered per failure mode.